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SCANNING ELECTRON MICROSCOPY

ClassOfActivity

http://data.posccaesar.org/rdl/RDS9700532

hasCreationDate2006.09.04
hasCreatoru20683
hasDefinitionElectron microscopy by which the beam of focused electrons moves across the object with the secondary electrons produced by the object and the electrons scattered by the object being collected to form three-dimensional image on a cathode-ray tube
hasDesignationSCANNING ELECTRON MICROSCOPY
hasDesignationAbbrev970053200
hasIdPCARDS9700532
hasStatusQualified

Referenced by (5)

ResourceVia
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RDS10617632hasRepresented
RDS18312997hasClassified
RDS18341999hasSubclass
RDS999888796hasRepresented